Summary
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Authors: Vassilis D. Tsakanikas, Panagiotis K. Siogkas, Vassiliki T. Potsika, Dimitris S. Pleouras, Vassiliki I.Kigka, Themis P. Exarchos, Igor B. Koncar and Dimitrios I. Fotiadis
Journal publisher: IEEE
Published year: 2023
DOI identifier: 10.5281/zenodo.10723046