Summary
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Authors: Panagiotis K. Siogkas, Dimitrios S. Pleouras, Vasilis D. Tsakanikas, Vassiliki T. Potsika, Antonis Sakellarios,Evdokia Karamouzi, Foteini Lagiou, George Charalampopoulos, George Galyfos,Fragiska Sigala, Igor Koncar and Dimitrios I. Fotiadi
Journal publisher: IEEE
Published year: 2023
DOI identifier: 10.5281/zenodo.10720597