Elevation profile estimation for single pass bi-static SAR tomography using Compressed Sensing

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Authors: Saravanan Nagesh, Andrei Anghel, Joachim Ender

Journal title: IEEE International Geoscience and Remote Sensing Symposium (IGARSS) 2023

Journal number: July 16 – July 21, 2023

Journal publisher: IEEE

Published year: 2023

Published pages: N/A

DOI identifier: 10.1109/igarss52108.2023.10282952

ISBN: 979-8-3503-2010-7