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Authors: Jose Saldana, Ruben Munilla, Salim Eryigit, Omer Topal, Jose RuizMas, Julian Fernandez-Navajas, Luis Sequeira
Journal title: IEEE Access
Journal publisher: Institute of Electrical and Electronics Engineers Inc.
Published year: 2018
Published pages: 1-1
DOI identifier: 10.1109/ACCESS.2018.2844088
ISSN: 2169-3536