Reduced order models for uncertainty management and zero-defect control in seal manufacturing

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Authors: Ismael Viejo Monge, Noelia Alcala Serrano, Salvador Izquierdo, Ignacio Conde Vallejo, Valentina Zambrano, Leticia A. Gracia Grijota

Journal title: 2019 IEEE 17th International Conference on Industrial Informatics (INDIN)

Journal publisher: IEEE

Published year: 2019

Published pages: 1627-1630

DOI identifier: 10.1109/indin41052.2019.8972097

ISBN:978-1-7281-2927-3

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