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Authors: Alessandro Mingotti, Lorenzo Peretto, Roberto Tinarelli, Kenan Yigit
Journal title: IEEE Transactions on Instrumentation and Measurement
Journal number: 66/9
Journal publisher: Institute of Electrical and Electronics Engineers
Published year: 2017
Published pages: 2258-2265
DOI identifier: 10.1109/TIM.2017.2677620
ISSN: 0018-9456