Strategies for Characterization and Parameter Extraction of Vertical Junction-less Nanowire FETs dedicated to Design Technology Co-Optimization

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Authors: C. Maneux, C. Mukherjee, M. Deng, G. Larrieu, Y. Wang, Houssem Rezgui and B. Neckel Wesling

Journal title: 243rd ECS Meeting, Boston, US, May 28th -June 2nd, 2023

Journal number: mai-23

Journal publisher: ECS

Published year: 2023

DOI identifier: 10.1149/11101.0209ecst