Thermal consideration in nanoscale gate-all-around vertical transistors

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Authors: Guilhem Larrieu, Houssem Rezgui, Abhishek Kumar, Jonas Müller, Sylvain Pelloquin, Yifan Wang, Marina Deng, Aurelie Lecestre, Cristell Maneux, Chhandak Mukherjee

Journal title: 2023 Silicon Nanoelectronics Workshop (SNW), Kyoto, Japan

Journal number: juin-23

Journal publisher: IEEE

Published year: 2023

DOI identifier: 10.23919/snw57900.2023.10183951

ISBN: 978-4-86348-808-3