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Authors: Pesti, K.; Metshein, M.; Annus, P.; Kõiv, H.; Min, M.
Journal title: IEEE Transactions on Instrumentation and Measurement
Journal number: 2021
Journal publisher: Institute of Electrical and Electronics Engineers
Published year: 2021
DOI identifier: 10.1109/tim.2020.3011784
ISSN: 0018-9456
