Summary
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Authors: Olev Martens, Raul Land, Mart Min, Paul Annus, Marek Rist
Journal title: 2020 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)
Journal publisher: IEEE
Published year: 2020
Published pages: 1-5
DOI identifier: 10.1109/i2mtc43012.2020.9128843
ISBN: 978-1-7281-4460-3
