Comparative characteristics of diffusion-welded high-voltage stacks and connected in series Schottky diodes

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Authors: N. Sleptsuk, O. Korolkov, R. Land, J. Toompuu, P. Annus, T. Rang

Journal title: 2016 15th Biennial Baltic Electronics Conference (BEC)

Journal publisher: IEEE

Published year: 2016

Published pages: 39-42

DOI identifier: 10.1109/BEC.2016.7743723

ISBN: 978-1-5090-1393-7