Study of Surface Defects in 4H-SiC Schottky Diodes Using a Scanning Kelvin Probe

This is a publication. If there is no link to the publication on this page, you can try the pre-formated search via the search engines listed on this page.

Authors: J. Mizsei, O. Korolkov, J. Toompuu, V. Mikli, T. Rang

Journal title: Materials Science Forum

Journal number: 16629752

Journal publisher: Trans Tech Publications

Published year: 2013

Published pages: 677-680

DOI identifier: 10.4028/www.scientific.net/MSF.740-742.677

ISSN: 1662-9752