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Authors: J. Ojarand, P. Annus, M. Min, M. Gorev, P. Ellervee
Journal title: 2014 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings
Journal publisher: IEEE
Published year: 2014
Published pages: 829-832
DOI identifier: 10.1109/I2MTC.2014.6860859
ISBN: 978-1-4673-6386-0
