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Authors: J. Ojarand, M. Rist, M. Min
Journal title: 2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings
Journal publisher: IEEE
Published year: 2015
Published pages: 1801-1806
DOI identifier: 10.1109/I2MTC.2015.7151554
ISBN: 978-1-4799-6114-6
