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Authors: Märtens, O.; Metshein, M.; Abdullayev, A.; Larras, B.; Frappe, A.; Gautier, A.; Saeed, M.; John, D.; Cardiff, B.; Krivošei, A.; Annus, P.; Rist, M.
Journal title: Proceedings of the IEEE Instrumentation and Measurement Technology Conference (I2MTC2022)
Journal publisher: IEEE
Published year: 2022
DOI identifier: 10.1109/i2mtc48687.2022.9806596
ISBN: 978-1-6654-8360-5
