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Authors: Michal Polic, Stanislav Steidl, Cenek Albl, Zuzana Kukelova, Tomas Pajdla
Journal title: 2020 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR)
Journal publisher: IEEE
Published year: 2020
Published pages: 5990-5999
DOI identifier: 10.1109/cvpr42600.2020.00603
ISBN: 978-1-7281-7168-5
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