Using C ˇ erenkov radiation for measuring the refractive index in thick samples by interferometric cathodoluminescence

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Authors: Michael Stöger-Pollach, Stefan Löffler, Niklas Maurer, Kristýna Bukvišová

Journal title: Ultramicroscopy

Journal number: 214

Journal publisher: Elsevier BV

Published year: 2020

Published pages: 113011

DOI identifier: 10.1016/j.ultramic.2020.113011

ISSN: 0304-3991