Fundamentals of cathodoluminescence in a STEM: The impact of sample geometry and electron beam energy on light emission of semiconductors

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Authors: Michael Stöger-Pollach, Kristýna Bukvišová, Sabine Schwarz, Michal Kvapil, Tomáš Šamořil, Michal Horák

Journal title: Ultramicroscopy

Journal number: 200

Journal publisher: Elsevier BV

Published year: 2019

Published pages: 111-124

DOI identifier: 10.1016/j.ultramic.2019.03.001

ISSN: 0304-3991