Fast identification of true critical paths in sequential circuits

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Authors: Raimund Ubar, Sergei Kostin, Maksim Jenihhin, Jaan Raik, Lembit Jürimägi

Journal title: Microelectronics Reliability

Journal number: 81

Journal publisher: Elsevier BV

Published year: 2018

Published pages: 252-261

DOI identifier: 10.1016/j.microrel.2017.11.027

ISSN: 0026-2714