Comprehensive performance and robustness analysis of 2D turn models for network-on-chips

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Authors: Siavoosh Payandeh Azad, Behrad Niazmand, Karl Janson, Thilo Kogge, Jaan Raik, Gert Jervan, Thomas Hollstein

Journal title: 2017 IEEE International Symposium on Circuits and Systems (ISCAS)

Journal publisher: IEEE

Published year: 2017

Published pages: 1-4

DOI identifier: 10.1109/ISCAS.2017.8050634

ISBN: 978-1-4673-6853-7