Automated area and coverage optimization of minimal latency checkers

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Authors: Siavoosh Payandeh Azad, Behrad Niazmand, Apneet Kaur Sandhu, Jaan Raik, Gert Jervan, Thomas Hollstein

Journal title: 2017 22nd IEEE European Test Symposium (ETS)

Journal publisher: IEEE

Published year: 2017

Published pages: 1-2

DOI identifier: 10.1109/ETS.2017.7968211

ISBN: 978-1-5090-5457-2