From online fault detection to fault management in Network-on-Chips: A ground-up approach

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Authors: Siavoosh Payandeh Azad, Behrad Niazmand, Karl Janson, Nevin George, Adeboye Stephen Oyeniran, Tsotne Putkaradze, Apneet Kaur, Jaan Raik, Gert Jervan, Raimund Ubar, Thomas Hollstein

Journal title: 2017 IEEE 20th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)

Journal publisher: IEEE

Published year: 2017

Published pages: 48-53

DOI identifier: 10.1109/DDECS.2017.7934565

ISBN: 978-1-5386-0472-4