A scalable technique to identify true critical paths in sequential circuits

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Authors: Raimund Ubar, Sergei Kostin, Maksim Jenihhin, Jaan Raik

Journal title: 2017 IEEE 20th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)

Journal publisher: IEEE

Published year: 2017

Published pages: 152-157

DOI identifier: 10.1109/DDECS.2017.7934568

ISBN: 978-1-5386-0472-4