Run-time reconfigurable instruments for advanced board-level testing

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Authors: Igor Aleksejev, Artur Jutman, Sergei Devadze

Journal title: IEEE Instrumentation & Measurement Magazine

Journal number: 20/4

Journal publisher: Institute of Electrical and Electronics Engineers

Published year: 2017

Published pages: 23-30

DOI identifier: 10.1109/MIM.2017.8006390

ISSN: 1094-6969