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Authors: Behrad Niazmand, Siavoosh Payandeh Azad, Tara Ghasempouri, Jaan Raik, Gert Jervan
Journal title: 2018 IEEE International Test Conference in Asia (ITC-Asia)
Journal publisher: IEEE
Published year: 2018
Published pages: 139-144
DOI identifier: 10.1109/itc-asia.2018.00034
ISBN: 978-1-5386-5180-3