A tool for random test generation targeting high diagnostic resolution

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Authors: Emmanuel Ovie Osimiry, Sergei Kostin, Jaan Raik, Raimund Ubar

Journal title: 2016 15th Biennial Baltic Electronics Conference (BEC)

Journal publisher: IEEE

Published year: 2016

Published pages: 79-82

DOI identifier: 10.1109/bec.2016.7743733

ISBN: 978-1-5090-1393-7