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Authors: Tara Ghasempouri, Siavoosh Payandeh Azad, Behrad Niazmand, Jaan Raik
Journal title: 2018 IEEE International Test Conference in Asia (ITC-Asia)
Journal publisher: IEEE
Published year: 2018
Published pages: 61-66
DOI identifier: 10.1109/itc-asia.2018.00021
ISBN: 978-1-5386-5180-3