Parallel Critical Path Tracing Fault Simulation in Sequential Circuits

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Authors: Jaak Kousaar, Raimund Ubar, Sergei Kostin, Sergei Devadze, Jaan Raik

Journal title: "2018 25th International Conference ""Mixed Design of Integrated Circuits and System"" (MIXDES)"

Journal publisher: IEEE

Published year: 2018

Published pages: 305-310

DOI identifier: 10.23919/mixdes.2018.8436880

ISBN: 978-83-63578-14-5