Fault Collapsing in Digital Circuits Using Fast Fault Dominance and Equivalence Analysis with SSBDDs

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Authors: Raimund Ubar, Lembit Jürimägi, Elmet Orasson, Jaan Raik

Journal title: VLSI-SoC: Design for Reliability, Security, and Low Power

Journal number: 483

Journal publisher: Springer International Publishing

Published year: 2016

Published pages: 23-45

DOI identifier: 10.1007/978-3-319-46097-0_2

ISBN: 978-3-319-46096-3