High-level modeling and testing of multiple control faults in digital systems

This is a publication. If there is no link to the publication on this page, you can try the pre-formated search via the search engines listed on this page.

Authors: Artjom Jasnetski, Stephen Adeboye Oyeniran, Anton Tsertov, Mario Scholzel, Raimund Ubar

Journal title: 2016 IEEE 19th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)

Journal publisher: IEEE

Published year: 2016

Published pages: 1-6

DOI identifier: 10.1109/ddecs.2016.7482445

ISBN: 978-1-5090-2467-4