High-level test data generation for software-based self-test in microprocessors

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Authors: Adeboye Stephen Oyeniran, Artjom Jasnetski, Anton Tsertov, Raimund Ubar

Journal title: 2017 6th Mediterranean Conference on Embedded Computing (MECO)

Journal publisher: IEEE

Published year: 2017

Published pages: 1-6

DOI identifier: 10.1109/meco.2017.7977167

ISBN: 978-1-5090-6742-8