IEEE 1687 Compliant Ecosystem for Embedded Instrumentation Access and In-Field Health Monitoring

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Authors: Anton Tsertov, Artur Jutman, Konstantin Shibin, Sergei Devadze

Journal title: 2018 IEEE AUTOTESTCON

Journal publisher: IEEE

Published year: 2018

Published pages: 1-9

DOI identifier: 10.1109/autest.2018.8532559

ISBN: 978-1-5386-5223-7