Minimization of the High-Level Fault Model for Microprocessor Control Parts

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Authors: Raimund Ubar, Adeboye Stephen Oyeniran, Olusiji Medaiyese

Journal title: 2018 16th Biennial Baltic Electronics Conference (BEC)

Journal publisher: IEEE

Published year: 2018

Published pages: 1-4

DOI identifier: 10.1109/bec.2018.8600980

ISBN: 978-1-5386-7312-6