Multiple control fault testing in digital systems with high-level decision diagrams

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Authors: Raimund Ubar, Stephen Adeboye Oyeniran

Journal title: 2016 IEEE International Conference on Automation, Quality and Testing, Robotics (AQTR)

Journal publisher: IEEE

Published year: 2016

Published pages: 1-6

DOI identifier: 10.1109/aqtr.2016.7501287

ISBN: 978-1-4673-8692-0