Summary
This is a publication. If there is no link to the publication on this page, you can try the pre-formated search via the search engines listed on this page.
Authors: Artjom Jasnetski, Raimund Ubar, Anton Tsertov
Journal title: 2016 17th Latin-American Test Symposium (LATS)
Journal publisher: IEEE
Published year: 2016
Published pages: 177-177
DOI identifier: 10.1109/latw.2016.7483357
ISBN: 978-1-5090-1331-9