On coverage of timing related faults at board level

Summary

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Authors: Artur Jutman, Igor Aleksejev, Sergei Devadze

Journal title: 2016 21th IEEE European Test Symposium (ETS)

Journal publisher: IEEE

Published year: 2016

Published pages: 1-2

DOI identifier: 10.1109/ets.2016.7519295

ISBN: 978-1-4673-9659-2