On-line fault classification and handling in IEEE1687 based fault management system for complex SoCs

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Authors: Konstantin Shibin, Sergei Devadze, Artur Jutman

Journal title: 2016 17th Latin-American Test Symposium (LATS)

Journal publisher: IEEE

Published year: 2016

Published pages: 69-74

DOI identifier: 10.1109/latw.2016.7483342

ISBN: 978-1-5090-1331-9