Optimization of Boundary Scan Tests Using FPGA-Based Efficient Scan Architectures

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Authors: Igor Aleksejev, Sergei Devadze, Artur Jutman, Konstantin Shibin

Journal title: Journal of Electronic Testing

Journal number: 32/3

Journal publisher: Kluwer Academic Publishers

Published year: 2016

Published pages: 245-255

DOI identifier: 10.1007/s10836-016-5588-y

ISSN: 0923-8174