QoSinNoC: Analysis of QoS-Aware NoC Architectures for Mixed-Criticality Applications

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Authors: Serhiy Avramenko, Siavoosh Payandeh Azad, Stefano Esposito, Behrad Niazmand, Massimo Violante, Jaan Raik, Maksim Jenihhin

Journal title: 2018 IEEE 21st International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)

Journal publisher: IEEE

Published year: 2018

Published pages: 67-72

DOI identifier: 10.1109/ddecs.2018.00-10

ISBN: 978-1-5386-5754-6