Replication-Based Deterministic Testing of 2-Dimensional Arrays with Highly Interrelated Cells

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Authors: Siavoosh Payandeh Azad, Adeboye Stephen Oyeniran, Raimund Ubar

Journal title: 2018 IEEE 21st International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)

Journal publisher: IEEE

Published year: 2018

Published pages: 21-26

DOI identifier: 10.1109/ddecs.2018.00011

ISBN: 978-1-5386-5754-6