Scalable algorithm for structural fault collapsing in digital circuits

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Authors: Raimund Ubar, Lembit Jurimagi, Elmet Orasson, Jaan Raik

Journal title: 2015 IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC)

Journal publisher: IEEE

Published year: 2015

Published pages: 171-176

DOI identifier: 10.1109/vlsi-soc.2015.7314411

ISBN: 978-1-4673-9140-5