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Authors: Karl Janson, Carl Johann Treudler, Thomas Hollstein, Jaan Raik, Maksim Jenihhin, Goerschwin Fey
Journal title: 2018 IEEE 21st International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)
Journal publisher: IEEE
Published year: 2018
Published pages: 147-152
DOI identifier: 10.1109/ddecs.2018.00033
ISBN: 978-1-5386-5754-6