Universal mitigation of NBTI-induced aging by design randomization

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Authors: Maksim Jenihhin, Alexander Kamkin, Zainalabedin Navabi, Somayeh Sadeghi-Kohan

Journal title: 2016 IEEE East-West Design & Test Symposium (EWDTS)

Journal publisher: IEEE

Published year: 2016

Published pages: 1-5

DOI identifier: 10.1109/ewdts.2016.7807635

ISBN: 978-1-5090-0693-9