Automated software-based self-test generation for microprocessors

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Authors: Artjom Jasnetski, Raimund Ubar, Anton Tsertov

Journal title: "2017 MIXDES - 24th International Conference ""Mixed Design of Integrated Circuits and Systems"

Journal publisher: IEEE

Published year: 2017

Published pages: 453-458

DOI identifier: 10.23919/mixdes.2017.8005252

ISBN: 978-83-63578-12-1