BASTION: Board and SoC test instrumentation for ageing and no failure found

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Authors: Artur Jutman, Christophe Lotz, Erik Larsson, Matteo Sonza Reorda, Maksim Jenihhin, Jaan Raik, Hans Kerkhoff, Rene Krenz-Baath, Piet Engelke

Journal title: Design, Automation & Test in Europe Conference & Exhibition (DATE), 2017

Journal publisher: IEEE

Published year: 2017

Published pages: 115-120

DOI identifier: 10.23919/DATE.2017.7926968

ISBN: 978-3-9815370-8-6