Rejuvenation of NBTI-Impacted Processors Using Evolutionary Generation of Assembler Programs

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Authors: Francesco Pellerey, Maksim Jenihhin, Giovanni Squillero, Jaan Raik, Matteo Sonza Reorda, Valentin Tihhomirov, Raimund Ubar

Journal title: 2016 IEEE 25th Asian Test Symposium (ATS)

Journal publisher: IEEE

Published year: 2016

Published pages: 304-309

DOI identifier: 10.1109/ATS.2016.57

ISBN: 978-1-5090-3809-1