Automated Design Error Localization in RTL Designs

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Authors: Maksim Jenihhin, Anton Tsepurov, Valentin Tihhomirov, Jaan Raik, Hanno Hantson, Raimund Ubar, Gunter Bartsch, JorgeHernan Meza Escobar, Heinz-Dietrich Wuttke

Journal title: IEEE Design & Test

Journal number: 21682356

Journal publisher: IEEE Computer Society

Published year: 2014

Published pages: 83-92

DOI identifier: 10.1109/MDAT.2013.2271420

ISSN: 2168-2356