Automated design error debug using high-level decision diagrams and mutation operators

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Authors: Jaan Raik, Urmas Repinski, Anton Chepurov, Hanno Hantson, Raimund Ubar, Maksim Jenihhin

Journal title: Microprocessors and Microsystems

Journal number: 01419331

Journal publisher: Elsevier BV

Published year: 2013

Published pages: 505-513

DOI identifier: 10.1016/j.micpro.2012.11.004

ISSN: 0141-9331