Rejuvenation of Nanoscale Logic at NBTI-Critical Paths Using Evolutionary TPG

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Authors: Palermo, N.; Tihhomirov, V.; Copetti, T.S.; Jenihhin, M.; Raik, J.; Kostin, S.; Gaudesi, M.; Squillero, G.; Sonza Reorda, M.; Vargas, F.; Bolzani Poehls, L.

Journal title: 16th IEEE Latin-American Test Symposium March 25 - 27, 2015, Puerto Vallarta, Mexico

Journal publisher: IEEE Computer Society Press

Published year: 2015

Published pages: 1-6