Scalable Algorithm for Structural Fault Collapsing in Digital Circuits

This is a publication. If there is no link to the publication on this page, you can try the pre-formated search via the search engines listed on this page.

Authors: Ubar, Raimund; Jürimägi, Lembit; Orasson, Elmet; Raik, Jaan

Journal title: IFIP/IEEE International Conference on Very Large Scale Integration - VLSI-SoC'2015

Journal publisher: IEEE Computer Society Press

Published year: 2015

Published pages: 1-6